filename     : Bic06a.pdf
entry        : 
pages        : 168
year         : 2006
month        : August
title        : Processing and Editing of Faces using a Measurement-Based Skin Reflectance Model
subtitle     :
author       : Bernd Bickel, ETH Zurich; Tim Weyrich, ETH Zurich; Wojciech Matusik, MERL; Hanspeter Pfister, MERL; Craig Donner, UC San Diego; Chien Tu, MERL; Janet McAndless, MERL; Jinho Lee, MERL; Addy Ngan, MIT; Henrik Wann Jensen, UC San Diego
Markus Gross, ETH Zurich
booktitle    : SIGGRAPH '06: ACM SIGGRAPH 2006 Sketches
ISSN/ISBN    : 1-59593-364-6
editor       :
publisher    : ACM Press
publ.place   : Boston, Massachusetts
volume       :
issue        :
language     : English
keywords     : 
abstract     : In extension to our paper Analysis of Human Faces using a
Measurement-Based Skin Reflectance Model we describe the almost
fully automated face processing pipeline including the
custom-built acquisition system, calibration procedures, and rendering.
The underlying model is intuitive, physically plausible, and
allows easy face editing. Generated image quality approaches that
of real photographs.